High-energy X-ray diffuse scattering using Weissenberg flat-cone geometry

Journal of Applied Crystallography

Volumn 33, Issue 4, 2000, Pages 1046-1050

  Butler, B D ^a   Haeffner, D R ^b   Lee, P L ^b   Welberry, T R ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY DERIVATIVE;

ARTICLE; CAMERA; CRYSTAL; FILTER; FLUORESCENCE; GEOMETRY; LIGHT SCATTERING; MEASUREMENT; METHODOLOGY; TECHNIQUE; X RAY DIFFRACTION;

EID: 0034477992     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800005318     Document Type: Article

References (5)

1. Belokoneva, E. L. (1994). Russ. Chem. Rev. 63, 533-549.
2. Buerger, M. J. (1942). X-ray Crystallography. New York: Wiley.
3. Osborn, J. C. & Welberry, T. R. (1990). J. Appl. Cryst. 23, 476-484.
4. Stefanovich, S. Y., Mill, B. V. & Butashin, A. V. (1993). Kristallografiya, 38, 121-124.
5. Welberry, T. R. & Mayo, S. C. (1998). J. Appl. Cryst. 31, 154-162.