Jitter measurements of a PowerPC microprocessor using an analytic signal method

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 955-964

  Yamaguchi, Takahiro J ^a   Soma, Mani ^a   Halter, David ^a   Nissen, Jim ^a   Raina, Rajesh ^a   Ishida, Masahiro ^a   Watanabe, Toshifumi ^a  

^a ADVANTEST CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODE RAY OSCILLOSCOPES; JITTER; MICROPROCESSOR CHIPS; PHASE LOCKED LOOPS; PROBABILITY DENSITY FUNCTION; STATISTICAL METHODS; TIMING JITTER;

ANALYTIC SIGNAL METHOD; JITTER MEASUREMENT; PERIOD JITTER; ROOT MEAN SQUARE;

INTEGRATED CIRCUIT TESTING;

EID: 0034476677     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)