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Volumn , Issue , 2000, Pages 263-268

Detailed analysis of different short-circuit conditions for non-punch-through IGBTs

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; GATES (TRANSISTOR); SHORT CIRCUIT CURRENTS;

EID: 0034476511     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (10)
  • 1
    • 25344475465 scopus 로고
    • Dynamic IGBT short-circuit tests for evaluation and production
    • H. Gießibl: "Dynamic IGBT Short-Circuit Tests for Evaluation and Production". PCIM'94. Nürnberg, Proc. Power Conversion, 1994, pp. 413-418.
    • (1994) PCIM'94. Nürnberg, Proc. Power Conversion , pp. 413-418
    • Gießibl, H.1
  • 3
    • 0343314350 scopus 로고
    • Short circuit behavior for PT and NPT IGBT devices - Protection against explosion of the case by fuses
    • S Duong, S Raël, C. Schaeffer, J.F. de Palma: "Short Circuit Behavior for PT and NPT IGBT Devices - Protection Against Explosion of the Case by Fuses", EPE'95 Conf. Proc., 1995, pp. 1-249-1-254.
    • (1995) EPE'95 Conf. Proc. , pp. 1249-1254
    • Duong, S.1    Raël, S.2    Schaeffer, C.3    De Palma, J.F.4
  • 4
    • 0342879375 scopus 로고
    • The short circuit behavior of IGBTs based on different technologies
    • R. Kraus, M. Reddig, K. Hoffmann: "The Short Circuit Behavior of IGBTs based on Different Technologies", EPE'95 Conf Proc., 1995, pp. 1-157-1-160.
    • (1995) EPE'95 Conf Proc. , pp. 1157-1160
    • Kraus, R.1    Reddig, M.2    Hoffmann, K.3
  • 5
    • 0342879373 scopus 로고
    • Short circuit ruggedness, switching, and stationary behaviour of new high voltage IGBT in measurement and simulations
    • Y.C. Gerstenmaier, G.J.E. Scheller, M. Hierolzer: "Short Circuit Ruggedness, Switching, and Stationary Behaviour of New High Voltage IGBT in Measurement and Simulations", EPE'95 Conf. Proc., 1995, pp. 1-161-1-165.
    • (1995) EPE'95 Conf. Proc. , pp. 1161-1165
    • Gerstenmaier, Y.C.1    Scheller, G.J.E.2    Hierolzer, M.3
  • 10
    • 0026868079 scopus 로고
    • A 2000V non-punch-through IGBT with high ruggedness
    • T. Laska, G. Miller, J. Niedermeyr: "A 2000V Non-Punch-Through IGBT with High Ruggedness", Solid-State Electronics, Vol. 35, No. 5, 1992, pp. 681-685.
    • (1992) Solid-state Electronics , vol.35 , Issue.5 , pp. 681-685
    • Laska, T.1    Miller, G.2    Niedermeyr, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.