Path to one - picosecond accuracy

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 619-627

  Sartori, Luca ^a   West, Burnell G ^a  

^a SCHLUMBERGER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CALIBRATION; DESIGN FOR TESTABILITY; TABLE LOOKUP; TIMING CIRCUITS; WAVEFORM ANALYSIS;

MOORE LAW; TIMING ACCURACY;

BUILT-IN SELF TEST;

EID: 0034476392     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)