Built-in self-repair analyzer (CRESTA) for embedded DRAMs

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 567-574

  Kawagoe, Tomoya ^a   Ohtani, Jun ^a   Niiro, Mitsutaka ^a   Ooishi, Tukasa ^a   Hamada, Mitsuhiro ^a   Hidaka, Hideto ^a  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ASSOCIATIVE STORAGE; COMPUTER SIMULATION; DYNAMIC RANDOM ACCESS STORAGE; RESPONSE TIME (COMPUTER SYSTEMS);

BUILT-IN SELF REPAIR ANALYZER; EMBEDDED DYNAMIC RANDOM ACCESS MEMORY; SOFTWARE PACKAGE CRESTA;

BUILT-IN SELF TEST;

EID: 0034476165     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)