Terahertz reflectometry: A model system for the inverse problem

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn 1, Issue , 2000, Pages 242-

  Johnson, J L ^a   Dorney, T D ^a   Rudd, J V ^b   Mittleman, D M ^a  

^a Rice University   (United States)

^b Picometrix Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; INVERSE PROBLEMS; MATHEMATICAL MODELS; SINGLE MODE FIBERS;

ACOUSTIC SEISMOGRAPHY; HOMOLOGY; TERAHERTZ REFLECTOMETRY;

REFLECTOMETERS;

EID: 0034475875     PISSN: 10928081     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)