Effects of damage rate on formation of voids and dislocation loops in metals

ASTM Special Technical Publication

Volumn , Issue 1366, 2000, Pages 836-849

  Xu, Qiu ^a   Yoshiie, Toshimasa ^a   Iseki, Michio ^b  

^a KYOTO UNIVERSITY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; COPPER; CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); GOLD; NICKEL; RADIATION EFFECTS; VANADIUM;

INTERSTITIAL TYPE DISLOCATION LOOPS; MICROVOIDS; POSITRON ANNIHILATION; VACANCY CLUSTERS;

NEUTRON IRRADIATION;

EID: 0034475469     PISSN: 10403094     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1520/stp12435s     Document Type: Conference Paper

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