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Volumn 2000-January, Issue , 2000, Pages 493-496

Path selection and pattern generation for dynamic timing analysis considering power supply noise effects

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; COMPUTER SIMULATION; CROSSTALK; ELECTRIC POWER SUPPLIES TO APPARATUS; GENETIC ALGORITHMS; INTEGRATED CIRCUIT LAYOUT; INTERCONNECTION NETWORKS; MONTE CARLO METHODS; PROBABILITY DENSITY FUNCTION; SPURIOUS SIGNAL NOISE;

EID: 0034474847     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2000.896521     Document Type: Conference Paper
Times cited : (48)

References (12)
  • 1
    • 0032657615 scopus 로고    scopus 로고
    • Analysis of performance impact caused by power supply noise in deep submicron devices
    • June
    • Y.-M. Jiang and K.-T. Cheng. Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices. Proc. DAC, pages 760- 765, June 1999.
    • (1999) Proc. DAC , pp. 760-765
    • Jiang, Y.-M.1    Cheng, K.-T.2
  • 3
    • 0033326871 scopus 로고    scopus 로고
    • Delay testing considering power supply noise effects
    • pages, September
    • A. Krstic, Y.-M. Jiang, and K.-T. Cheng. Delay Testing Considering Power Supply Noise Effects. Proc. ITC, pages 181-190, September 1999.
    • (1999) Proc. ITC , pp. 181-190
    • Krstic, A.1    Jiang, Y.-M.2    Cheng, K.-T.3
  • 4
    • 0041692492 scopus 로고    scopus 로고
    • Performance sensitivity analysis using statistical methods and its applications to delay testing
    • January
    • J.-J. Liou, A. KrstiC, K.-T. Cheng, D. Mukherjee, and S. Kundu. Performance Sensitivity Analysis Using Statistical Methods and Its Applications to Delay Testing. Proc. ASP DAC, pages 587-592, January 2000.
    • (2000) Proc. ASP DAC , pp. 587-592
    • Liou, J.-J.1    KrstiC, A.2    Cheng, K.-T.3    Mukherjee, D.4    Kundu, S.5
  • 6
    • 0030651637 scopus 로고    scopus 로고
    • Analysis of ground bounce in deep sub-micron circuits
    • April
    • Y.-S. Chang, S. K. Gupta, and M. A. Breuer. Analysis of Ground Bounce in Deep Sub-Micron Circuits. Proc. VTS, pages 110-116, April 1997.
    • (1997) Proc. VTS , pp. 110-116
    • Chang, Y.-S.1    Gupta, S.K.2    Breuer, M.A.3
  • 7
    • 0030704451 scopus 로고    scopus 로고
    • Power supply noise analysis methodology for deep submicron VLSI chip design
    • pages, June
    • H. H. Chen and D. D. Ling. Power Supply Noise Analysis Methodology for Deep Submicron VLSI Chip Design. Proc. DAC. pages 638-643, June 1997.
    • (1997) Proc. DAC , pp. 638-643
    • Chen, H.H.1    Ling, D.D.2
  • 8
    • 0031642633 scopus 로고    scopus 로고
    • Estimation of maximum power supply noise for deep sub-micron designs
    • August
    • Y.-M. Jiang, K.-T. Cheng, and A.-C. Deng. Estimation of Maximum Power Supply Noise for Deep Sub-Micron Designs. Proc. of ISLPED, pages 233- 238, August 1998.
    • (1998) Proc. of ISLPED , pp. 233-238
    • Jiang, Y.-M.1    Cheng, K.-T.2    Deng, A.-C.3
  • 10
    • 0032218670 scopus 로고    scopus 로고
    • Pre- layout delay calculation specification for CMOS ASIC libraries
    • February
    • H. Edamatsu, K. Homma, M. Kakimoto, Y. Koike, and K. Tabuchi. Pre- Layout Delay Calculation Specification for CMOS ASIC Libraries. Proc. ASP DAC, pages 241-248, February 1998.
    • (1998) Proc. ASP DAC , pp. 241-248
    • Edamatsu, H.1    Homma, K.2    Kakimoto, M.3    Koike, Y.4    Tabuchi, K.5
  • 11
    • 0030655539 scopus 로고    scopus 로고
    • Estimation of maximum power and instantaneous current using a genetic algorithm
    • May
    • Y.-M. Jiang, K.-T. Cheng, and A. Krstic. Estimation of Maximum Power and Instantaneous Current Using A Genetic Algorithm. Proc. CICC, pages 135-138, May 1997.
    • (1997) Proc. CICC , pp. 135-138
    • Jiang, Y.-M.1    Cheng, K.-T.2    Krstic, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.