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Volumn 3, Issue , 2000, Pages 1600-1605
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Performance characterization of MOS and bipolar devices for the development of efficient and reliable electronic ballast
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONIC BALLASTS;
BALLASTS (LAMP);
ELECTRIC LOSSES;
HYBRID INTEGRATED CIRCUITS;
INSULATED GATE BIPOLAR TRANSISTORS;
SWITCHING SYSTEMS;
MOS DEVICES;
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EID: 0034474057
PISSN: 02759306
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/PESC.2000.880544 Document Type: Conference Paper |
Times cited : (2)
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References (3)
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