Summary of high-accuracy aperture-area measurement capabilities at the NIST

Metrologia

Volumn 37, Issue 5, 2000, Pages 621-623

  Fowler, Joel B ^a   Saunders, R D ^a   Parr, A C ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SCATTERING; PHOTOMETRY; RADIOMETRY;

OPTICAL APERTURE;

PLANIMETERS;

EID: 0034473340     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/37/5/63     Document Type: Article

References (6)