SOI MOSFET thermal conductance and its geometry dependence

IEEE International SOI Conference

Volumn , Issue , 2000, Pages 128-129

  Nakayama, Hajime ^a   Nakamura, Motoaki ^a   Komatsu, Hiroshi ^a   Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; CURRENT VOLTAGE CHARACTERISTICS; GATES (TRANSISTOR); LOGIC CIRCUITS; OXIDES; SEMICONDUCTOR DEVICE MODELS; SILICON ON INSULATOR TECHNOLOGY; SWITCHING; THERMAL CONDUCTIVITY; THIN FILMS;

FLOATING BODY DEVICES; SELF-HEATING;

MOSFET DEVICES;

EID: 0034472554     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)