SOI at IBM: Current status of technology, modeling, design, and the outlook for the 0.1 μm generation

IEEE International SOI Conference

Volumn , Issue , 2000, Pages 6-9

  Assaderaghi, Fari ^a   Shahidi, Ghavam ^a  

^a IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; HYSTERESIS; MICROPROCESSOR CHIPS; SEMICONDUCTOR DEVICE MODELS; SPURIOUS SIGNAL NOISE; VLSI CIRCUITS;

NOISE MARGIN;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0034472493     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)