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Volumn 1, Issue , 2000, Pages 191-194

Extrinsic loss mechanisms in BST for tunable RF/microwave passive components

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; DIELECTRIC LOSSES; DIELECTRIC RELAXATION; ELECTRIC FIELD EFFECTS; ELECTRIC VARIABLES MEASUREMENT; GRAIN SIZE AND SHAPE; PERMITTIVITY; PERMITTIVITY MEASUREMENT; Q FACTOR MEASUREMENT; SINTERING;

EID: 0034471901     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (5)
  • 2
    • 0005923981 scopus 로고    scopus 로고
    • Measuring the dielectric constant of solids with the HP 8510 network analyzer
    • Hewlett-Packard Inc., Product Note 8510-3, Materials Measurement; currently Agilent Technologies Inc.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.