Maximum likelihood estimator for jitter noise models

IEEE Transactions on Instrumentation and Measurement

Volumn 49, Issue 6, 2000, Pages 1282-1284

  Vandersteen, Gerd ^a   Pintelon, Rik ^b  

^a IMEC   (Belgium)

^b VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; JITTER; SAMPLING; SPURIOUS SIGNAL NOISE;

JITTER NOISE MODELS; MAXIMUM LIKELIHOOD ESTIMATOR;

MAXIMUM LIKELIHOOD ESTIMATION;

EID: 0034469266     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.893271     Document Type: Article

References (5)

1. IEEE Standard for Digitizing Waveform Recorders, IEEE Std. 1057-1994.
2. M. Souder, D. R. Flach, C. Hagwood, and G. L. Yang, "The effects of timing jitter in sampling systems," IEEE Trans. Instrum. Meas., vol. 39, pp. 80-85, Feb. 1990.
3. J. Schoukens, R. Pintelon, and G. Vandersteen, "A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter," IEEE Trans. Instrum. Meas., vol. 46, no. 4, pp. 1005-1010, 1997.
4. M. Kendall, A. Stuart, and O. J. Keith, The Advanced Theory of Statistics: vol. I, 4th ed. London, U.K.: Griffin, 1979.
5. J. P. Norton, An Introduction to Identification. New York: Academic, 1986.