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Volumn 49, Issue 6, 2000, Pages 1206-1210

Stability evaluation of high-precision multifunction instruments for traceability transfer

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC POTENTIAL; ELECTRIC VARIABLES MEASUREMENT; RESISTORS; SPECIFICATIONS; STABILITY; STANDARDS; VOLTAGE DIVIDERS;

EID: 0034468315     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.893257     Document Type: Article
Times cited : (18)

References (7)
  • 1
    • 33749907981 scopus 로고    scopus 로고
    • A generic DMM test and calibration strategy
    • July/Aug.
    • P. B. Crisp, "A generic DMM test and calibration strategy," Int. J. Petrol., pp. 24-34, July/Aug. 1997.
    • (1997) Int. J. Petrol. , pp. 24-34
    • Crisp, P.B.1
  • 2
    • 33749942794 scopus 로고
    • A system for traceability maintenance and verification based on high stability multimeters
    • Torino, Italy
    • G. C. Bosco, G. La Paglia, U. Pogliano, and G. Zago, "A system for traceability maintenance and verification based on high stability multimeters," in Proc. XIII IMEKO World Congr., Torino, Italy, 1994, pp. 517-522.
    • (1994) Proc. XIII IMEKO World Congr. , pp. 517-522
    • Bosco, G.C.1    La Paglia, G.2    Pogliano, U.3    Zago, G.4
  • 3
    • 33749937366 scopus 로고
    • An alternative approach to ensure traceability utilizing high stability multimeters
    • Nimes, France
    • U. Pogliano, G. C. Bosco, R. Cerri, and G. La Paglia, "An alternative approach to ensure traceability utilizing high stability multimeters," in Proc. Métrologie'97, Nimes, France, 1995, pp. 346-351.
    • (1995) Proc. Métrologie'97 , pp. 346-351
    • Pogliano, U.1    Bosco, G.C.2    Cerri, R.3    La Paglia, G.4
  • 5
    • 33749920165 scopus 로고    scopus 로고
    • Getting the best out of long scale DMMs in metrology application
    • P. B. Crisp, "Getting the best out of long scale DMMs in metrology application," in MCSL Workshop and Symp., 1997, pp. 151-160.
    • (1997) MCSL Workshop and Symp. , pp. 151-160
    • Crisp, P.B.1
  • 6
    • 33749915193 scopus 로고    scopus 로고
    • DMMs high linearity eases resistance calibration
    • Feb./Mar.
    • _, "DMMs high linearity eases resistance calibration," in Test and Measurement Europe, Feb./Mar. 1998, pp. 26-28.
    • (1998) Test and Measurement Europe , pp. 26-28


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.