Tantalum Thin-Film Superconducting Transition Edge Thermometers

Journal of Low Temperature Physics

Volumn 121, Issue 5-6, 2000, Pages 821-824

  Mohazzab, Masoud ^a   Mulders, Norbert ^a   Nash, Al ^b   Larson, Melora ^b  

^a UNIVERSITY OF DELAWARE   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; HEAT TREATMENT; SPUTTER DEPOSITION; STRENGTH OF MATERIALS; SUPERCONDUCTING FILMS; SUPERCONDUCTING TRANSITION TEMPERATURE; TANTALUM; THIN FILMS;

SUPERCONDUCTING EDGE TEMPERATURE; TANTALUM THIN FILM;

THERMOMETERS;

EID: 0034461102     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1017589611451     Document Type: Article

References (1)

1. J. J. Hauser and H. C. Theuerer, Rev. Mod. Phys. 36, 80 (1964).