Development of a new ULT Scanning Tunneling Microscope at University of Tokyo

Journal of Low Temperature Physics

Volumn 121, Issue 5-6, 2000, Pages 803-808

  Matsui, Tomohiro ^a   Kambara, Hiroshi ^a   Fukuyama, Hiroshi ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; LOW TEMPERATURE OPERATIONS; MAGNETIC FIELDS; SILICON; SILICON COMPOUNDS; SPECIFIC HEAT; STRENGTH OF MATERIALS; TEMPERATURE; VACUUM APPLICATIONS;

ATOMIC RESOLUTION; SILICON SILVER; ULTRA LOW TEMPERATURE SCANNING TUNNELING MICROSCOPE; UNIVERSITY OF TOKYO;

SCANNING TUNNELING MICROSCOPY;

EID: 0034461101     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1017533526472     Document Type: Article

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