X-ray Scattering Measurements of Helium Adsorption into Silica Aerogel

Journal of Low Temperature Physics

Volumn 121, Issue 5-6, 2000, Pages 591-596

  Lurio, L B ^a   Mulders, N ^b   Paetkau, M ^c   Lee, M ^d   Mochri, S G J ^e   Chan, M H W ^c  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b UNIVERSITY OF DELAWARE   (United States)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

^d SOUTHERN ILLINOIS UNIVERSITY   (United States)

^e NONE

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; AEROGELS; FILMS; MATHEMATICAL MODELS; PHASE COMPOSITION; PHASE EQUILIBRIA; POROUS MATERIALS; SILICA GEL; VAPOR PRESSURE; X RAY SCATTERING;

LIQUID FILMS; PHASE COEXISTENCE; SMALL ANGLE X RAY SCATTERING; X RAY SCATTERING MEASUREMENTS;

HELIUM;

EID: 0034459215     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1017563411026     Document Type: Article

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