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Volumn 16, Issue 1, 2000, Pages 55-69

Broad-band microwave dielectric property characterization and nondestructive inspection of various glass specimens

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; MICROWAVE MEASUREMENT; NONDESTRUCTIVE EXAMINATION;

EID: 0034458852     PISSN: 10589759     EISSN: None     Source Type: Journal    
DOI: 10.1080/10589750008953063     Document Type: Article
Times cited : (3)

References (19)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.