|
Volumn 16, Issue 1, 2000, Pages 55-69
|
Broad-band microwave dielectric property characterization and nondestructive inspection of various glass specimens
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DIELECTRIC PROPERTIES;
MICROWAVE MEASUREMENT;
NONDESTRUCTIVE EXAMINATION;
MICROWAVE DIELECTRIC PROPERTY CHARACTERIZATION;
BOROSILICATE GLASS;
|
EID: 0034458852
PISSN: 10589759
EISSN: None
Source Type: Journal
DOI: 10.1080/10589750008953063 Document Type: Article |
Times cited : (3)
|
References (19)
|