Free carrier lifetime reduction in silicon by electron-beam irradiation

Proceedings of the International Semiconductor Conference, CAS

Volumn 1, Issue , 2000, Pages 255-258

  Codreanu, C ^a   Vasile, E ^a   Iliescu, E ^a   Avram, M ^a   Badoiu, A ^a   Ravariu, C ^a  

^a NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT IN MICROTECHNOLOGIES   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRON ENERGY LEVELS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES; SWITCHING CIRCUITS;

BAND GAP;

ELECTRON IRRADIATION;

EID: 0034453904     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)