Reliability issues for silicon-on-insulator

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2000, Pages 131-134

  Bolam, R ^a   Shahidi, G ^a   Assaderaghi, F ^a   Khare, M ^a   Mocuta, A ^a   Hook, T ^a   Wu, E ^a   Leobandung, E ^a   Voldman, S ^a   Badami, D ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRON TRAPS; FABRICATION; HOLE TRAPS; MICROPROCESSOR CHIPS; MOS DEVICES; RELIABILITY; ULSI CIRCUITS;

TIME DEPENDENT DIELECTRIC BREAKDOWN (TDDB);

SILICON ON INSULATOR TECHNOLOGY;

EID: 0034453373     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)