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Volumn 6, Issue 4, 2000, Pages 295-300
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Local stress measurement in notched sapphire by Raman microspectroscopy
a
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Author keywords
Finite element method; Local stress measurement; Raman microspectroscopy; Sapphire
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Indexed keywords
BENDING (DEFORMATION);
CERAMIC MATERIALS;
CRYSTAL LATTICES;
FINITE ELEMENT METHOD;
LASER BEAMS;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
RESIDUAL STRESSES;
SINGLE CRYSTALS;
STRAIN;
STRESS ANALYSIS;
LOCAL STRESS MEASUREMENT;
NOTCHED SAPPHIRE;
RAMAN MICROSPECTROSCOPY;
SAPPHIRE;
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EID: 0034453154
PISSN: 13411683
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (12)
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References (11)
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