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Volumn 6, Issue 4, 2000, Pages 295-300

Local stress measurement in notched sapphire by Raman microspectroscopy

Author keywords

Finite element method; Local stress measurement; Raman microspectroscopy; Sapphire

Indexed keywords

BENDING (DEFORMATION); CERAMIC MATERIALS; CRYSTAL LATTICES; FINITE ELEMENT METHOD; LASER BEAMS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; RESIDUAL STRESSES; SINGLE CRYSTALS; STRAIN; STRESS ANALYSIS;

EID: 0034453154     PISSN: 13411683     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (12)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.