Substrate enhanced degradation of CMOS devices

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2000, Pages 323-326

  Driussi, Francesco ^a   Esseni, David ^a   Selmi, Luca ^a   Piazza, Fausto ^b  

^a UNIVERSITY OF UDINE   (Italy)

^b STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

HOT CARRIERS; MOSFET DEVICES; STRESS ANALYSIS;

CHANNEL HOT CARRIER (CHC);

CMOS INTEGRATED CIRCUITS;

EID: 0034452589     PISSN: 01631918     EISSN: None     Source Type: Journal    
DOI: 10.1109/IEDM.2000.904321     Document Type: Article

References (11)