The inspection of fabric defects by using wavelet transform

Journal of the Textile Institute

Volumn 91, Issue 3, 2000, Pages 420-433

  Hu, M C ^a   Tsai, I S ^a  

^a FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT; FABRIC PROPERTY; INSPECTION; NEURAL NETWORK; QUALITY CONTROL;

EID: 0034450329     PISSN: 00405000     EISSN: 17542340     Source Type: Journal    
DOI: 10.1080/00405000008659518     Document Type: Article

References (10)

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3. Daubechies, I., 1988. Orthonormal Bases of Compactly Supported Wavelets. Commun. Pure & Appl. Math., 41:909–996.
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10. Vangheluwe, L., Sette, S., and Pynckels, F., 1993. Assessment of Set Marks by Means of Neural Nets. Text. Res. J., 63:244–246.