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Volumn , Issue , 2000, Pages 270-273
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Characterization of lead-free solder by reliability testing
a b |
Author keywords
[No Author keywords available]
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Indexed keywords
CHIP SCALE PACKAGES;
LEAD ALLOYS;
MECHANICAL TESTING;
PRINTED CIRCUIT BOARDS;
RELIABILITY;
SOLDERING ALLOYS;
TIN ALLOYS;
LEAD CONTAMINATION;
TIN LEAD SOLDER ALLOYS;
TIN SILVER SOLDER;
ELECTRONICS PACKAGING;
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EID: 0034448322
PISSN: None
EISSN: None
Source Type: Journal
DOI: 10.1109/IEMT.2000.910737 Document Type: Article |
Times cited : (3)
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References (10)
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