Growth morphology and electronic structure of ultra-thin TaOx films on Ag(100)

Materials Research Society Symposium - Proceedings

Volumn 623, Issue , 2000, Pages 417-422

  Howard, M M ^a   Ventrice, C A ^a   Geisler, H ^b   Hite, D A ^c   Sprunger, P T ^c  

^a UNIVERSITY OF NEW ORLEANS   (United States)

^b XAVIER UNIVERSITY OF LOUISIANA   (United States)

^c LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; ENERGY GAP; FERMI LEVEL; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; PHOTOEMISSION; SILVER; SUBSTRATES; TANTALUM COMPOUNDS;

GROWTH MORPHOLOGY; INTERFACIAL OXIDE; THERMAL EVAPORATION;

ULTRATHIN FILMS;

EID: 0034448209     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: 10.1557/PROC-623-417     Document Type: Article

References (0)