A study of the crystallization of amorphous indium (Tin) oxide

Materials Research Society Symposium - Proceedings

Volumn 623, Issue , 2000, Pages 245-251

  Paine, D C ^a   Chason, E ^a   Chen, E ^a   Sparacin, D ^a   Yeom, H Y ^a  

^a BROWN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTALLIZATION; DENSIFICATION; DEPOSITION; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON BEAMS; EVAPORATION; OPTICAL SENSORS; RELAXATION PROCESSES; THIN FILMS;

AMORPHOUS INDIUM TIN OXIDE; ELECTRON BEAM EVAPORATION; MOLAR VOLUME; MULTIBEAM OPTICAL STRESS SENSOR;

INDIUM COMPOUNDS;

EID: 0034445839     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-623-245     Document Type: Conference Paper

References (12)