Analysis of bondline thickness effects on failure load in adhesively bonded structures

International SAMPE Technical Conference

Volumn 32, Issue , 2000, Pages 567-579

  Gleich, D M ^a   Van Tooren, M J L ^a   Beukers, A ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Interface stresses; Peel stresses; Stress singularity

Indexed keywords

FAILURE (MECHANICAL); INTERFACES (MATERIALS); LOADS (FORCES); PEELING; STRENGTH OF MATERIALS; STRESS CONCENTRATION; SURFACE TENSION; THICKNESS MEASUREMENT;

BONDLINE THICKNESS; INTERFACE STRESSES;

ADHESIVE JOINTS;

EID: 0034444004     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)