Effect of impact ionization in scaled pHEMTs

Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO

Volumn , Issue , 2000, Pages 236-241

  Kalna, K ^a   Asenov, A ^a   Elgaid, K ^a   Thayne, I ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; ELECTRON SCATTERING; ELECTRON TRANSPORT PROPERTIES; IMPACT IONIZATION; MONTE CARLO METHODS; PHONONS;

CRITICAL DRAIN VOLTAGES;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 0034443294     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)