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Volumn 3, Issue , 2000, Pages 2633-2638
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Fault detection using immune-based systems and formal language algorithms
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
ELECTRIC MACHINERY TESTING;
FAILURE ANALYSIS;
FORMAL LANGUAGES;
FAULT DETECTION;
IMMUNE SYSTEMS;
CONTROL THEORY;
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EID: 0034438614
PISSN: 01912216
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (13)
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References (6)
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