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Volumn 3, Issue , 2000, Pages 2633-2638

Fault detection using immune-based systems and formal language algorithms

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRIC MACHINERY TESTING; FAILURE ANALYSIS; FORMAL LANGUAGES;

EID: 0034438614     PISSN: 01912216     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (13)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.