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Volumn 27, Issue 1, 2001, Pages 6-12
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Allowable copper thickness for fine pitch patterns formed by a subtractive method
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Author keywords
Copper; Etchants; Etching; HDIS circuits; Printed circuit boards
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Indexed keywords
COPPER;
ETCHING;
PHOTORESISTS;
PRINTED CIRCUIT BOARDS;
PRINTED CIRCUIT TESTING;
THICKNESS MEASUREMENT;
ETCHANTS;
PITCH PATTERNS;
SUBTRACTIVE METHOD;
PRINTED CIRCUIT MANUFACTURE;
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EID: 0034435814
PISSN: 03056120
EISSN: None
Source Type: Journal
DOI: 10.1108/03056120110360237 Document Type: Article |
Times cited : (2)
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References (1)
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