New method to evaluate the subsurface defect by thermal nondestructive testing

Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

Volumn 19, Issue 6, 2000, Pages 457-459

  Mei, L ^a   Wang, Y W ^a   Xue, J ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Finite element; Infrared thermography; Mathematical model; Nondestructive testing

Indexed keywords

DEFECTS; FINITE ELEMENT METHOD; HEAT CONDUCTION; MATHEMATICAL MODELS;

1D TRANSIENT HEAT CONDUCTION; INFRARED THERMOGRAPHY; NONSTRUCTIVE TESTING;

INFRARED IMAGING;

EID: 0034435186     PISSN: 10019014     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. Theoretical analysis and computation of infrared nondestructive testing
2. A new quantitative method to measure the depth of subsurface defect in metal material
3. Surface transient temperature inversion for hidden corrosion characterization: Theory and applications