X-ray photoemission spectroscopic study of light-induced structural changes in amorphous silicon

Materials Research Society Symposium-Proceedings

Volumn 609, Issue , 2000, Pages A1011-A1016

  Sheng, Shuran ^a   Sacher, Edward ^a   Yelon, Arthur ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BINDING ENERGY; CRYSTALLINE MATERIALS; IRRADIATION; PHOTONS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

LIGHT-INDUCED STRUCTURAL CHANGES;

AMORPHOUS SILICON;

EID: 0034429796     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: 10.1557/proc-609-a10.1     Document Type: Article

References (14)