Precise and absolute measurements of the complex third-order optical susceptibility

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4106, Issue 1, 2000, Pages 349-359

  Santran, Stephane ^b   Canioni, Lionel ^b   Cardinal, Thierry ^c   Fargin, Evelyne ^c   Le Flem, Gilles ^c   Rouyer, Claude ^a   Sarger, Laurent ^b  

^a CEA CESTA   (France)

^b UMR 5798   (France)

^c INST CHIM MATIERE COND BORDEAUX   (France)

Author keywords

Inorganic materials; Instrumentation; Non linear optics; Third order optical susceptibility

Indexed keywords

FUSED SILICA; LIGHT ABSORPTION; LIGHT POLARIZATION; NEGATIVE IONS; NIOBIUM; POSITIVE IONS; REFRACTIVE INDEX; SOLID STATE LASERS; TELLURIUM; TITANIUM;

FEMTOSECOND LASER OSCILLATOR; NIOBIUM GLASS; NONLINEAR INDEX; TELLURIUM GLASS; THIRD ORDER OPTICAL SUSCEPTIBILITY; TITANIUM GLASS; ULTRASHORT PULSES;

NONLINEAR OPTICS;

EID: 0034429229     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.408524     Document Type: Article

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