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Volumn 2, Issue , 2000, Pages 1464-1471
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Simulation based cause and effect analysis of cycle time distribution in semiconductor backend
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Author keywords
[No Author keywords available]
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Indexed keywords
HEURISTIC METHODS;
MATERIALS HANDLING;
MATHEMATICAL MODELS;
CYCLE TIME DISTRIBUTION;
SEMICONDUCTOR BACKENDS;
INTEGRATED CIRCUIT MANUFACTURE;
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EID: 0034429115
PISSN: 02750708
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (12)
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