Measurements with the Chandra X-ray Observatory's Flight Contamination Monitor

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4138, Issue , 2000, Pages 1-9

  Elsner, R F ^a   Kolodziejczak, J J ^a   O'Dell, S L ^a   Swartz, D A ^a   Tennant, A F ^a   Weisskopf, M C ^a  

^a NASA MARSHALL SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; DATA ACQUISITION; SPACE FLIGHT; X RAY CAMERAS; X RAY SPECTROMETERS;

FLIGHT CONTAMINATION MONITORS (FCM); X RAY OPTICS;

MIRRORS;

EID: 0034428926     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.407552     Document Type: Conference Paper

References (11)