메뉴 건너뛰기




Volumn 15, Issue 4, 2000, Pages 1247-1254

Risk based voltage security assessment

Author keywords

Impact; Load margin sensitivity; Power system security; Probability; Risk assessment; Transmission; Voltage collapse

Indexed keywords

ECONOMIC AND SOCIAL EFFECTS; RISK ASSESSMENT; UNCERTAIN SYSTEMS; VOLTAGE CONTROL; VOLTAGE STABILIZING CIRCUITS;

EID: 0034428672     PISSN: 08858950     EISSN: None     Source Type: Journal    
DOI: 10.1109/59.898097     Document Type: Article
Times cited : (173)

References (17)
  • 4
    • 0026821376 scopus 로고
    • The continuation power flow: A tool for steady state voltage stability analysis
    • , Feb.
    • V. Ajjarapu and C. Christy, The continuation power flow: A tool for steady state voltage stability analysis, IEEE Trans, on Power Systems, vol. 7, no. 1, pp. 416-423, Feb. 1992.
    • (1992) IEEE Trans, on Power Systems , vol.7 , Issue.1 , pp. 416-423
    • Ajjarapu, V.1    Christy, C.2
  • 5
    • 33748011600 scopus 로고    scopus 로고
    • The sparse formulation of ISPS and its application to voltage stability margin sensitivity and estimation
    • B. Long and V. Ajjarapu, The sparse formulation of ISPS and its application to voltage stability margin sensitivity and estimation, IEEE Trans, on Power Systems, to be published.
    • IEEE Trans, on Power Systems, to Be Published.
    • Long, B.1    Ajjarapu, V.2
  • 6
    • 0031079074 scopus 로고    scopus 로고
    • Sensitivity of the loading margin to voltage collapse with respect to arbitrary parameters
    • , Feb.
    • S. Greene, I. Dobson, and F. L. Alvarado, Sensitivity of the loading margin to voltage collapse with respect to arbitrary parameters, IEEE Trans, on Power Systems, vol. 12, no. 1, pp. 262-272, Feb. 1997.
    • (1997) IEEE Trans, on Power Systems , vol.12 , Issue.1 , pp. 262-272
    • Greene, S.1    Dobson, I.2    Alvarado, F.L.3
  • 13
    • 33747986959 scopus 로고    scopus 로고
    • Reliability Test System Task Force of the Application of Probability Methods Subcommittee, The IEEE reliability test system-1996, 96 WM 326-9 PWRS.
    • The IEEE reliability test system , vol.1996


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.