SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 622, Issue , 2000, Pages

Silicon carbide die attach scheme for 500°c operation

(3) Chen, L Y a Hunter, G W a Neudeck, P G a

a NASA GLENN RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; ELECTRONICS PACKAGING; HEAT TREATMENT; HIGH TEMPERATURE EFFECTS; INTERFACES (MATERIALS); SCHOTTKY BARRIER DIODES; SINGLE CRYSTALS; THICK FILMS;

SEMICONDUCTOR ELECTRONICS;

SILICON CARBIDE;

EID: 0034428510 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: 10.1557/proc-622-t8.10.1 Document Type: Conference Paper

Times cited : (32)

References (6)

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2
- 0003684350
- 600 °C logic gates using silicon carbide JFET's
- March 20-23, Anaheim, CA. An earlier review article: Robert F. Davis, Galina Kelner, Michael Shur, John W. Palmour, and John A. Edmond, Thin film deposition and microelectronic and optoelectronic device fabrication and characyterization in monocrystalline alpha and beta silicon carbide, Special Issue on Large Bandgap Electronic Materials and Components, Proceedings of the IEEE, Vol.79, 5, 1991
- (2000) 2000 Government Microcircuit Applications Conference
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3
- 84885290209
- Thick film hybrid packaging techniques for 500 °C operation
- June 15-19, Albuquerque, New Mexico USA
- (1998) Transactions of Fourth International High Temperature Electronics Conference (HiTEC)
- Salmon, J.S.¹ Johnson, R.W.² Palmer, M.³

4
- 0003684352
- Thin and thick film materials based interconnection technology for 500 °C operation
- Santa Clara, CA, Feb. 7-11
- (2000) Transaction of First International AVS Conference on Microelectronics and Interfaces
- Chen, L.-Y.¹ Hunter, G.W.² Neudeck, P.G.³

5
- 0003610745
- New gold thick film compositions for fine line printing on various substrate surfaces
- (1996) 1996 ISHM Symposium
- Keusseyan, R.L.¹ Parr, R.² Speck, B.S.³ Crunpton, J.C.⁴ Chaplinsky, J.T.⁵ Roach, C.J.⁶ Valena, K.⁷ Horne, G.S.⁸

6
- 0033079571
- Electrical characterization of annealed Ti/TiN/Pt contacts on N-type 6H-SiC epilayer
- (1999) IEEE Transactions on Electron Devices , vol.46 , pp. 2
- Okojie, R.S.¹ Ned, A.A.² Kurtz, A.D.³ Carr, W.N.⁴

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