Multilayer grating for the Extreme Ultraviolet Spectrometer (EIS)

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4138, Issue , 2000, Pages 174-181

  Seely, John F ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MIRRORS; MULTILAYERS; ULTRAVIOLET SPECTROMETERS;

EXTREME ULTRAVIOLET SPECTROMETER (EIS); MULTILAYER GRATINGS;

DIFFRACTION GRATINGS;

EID: 0034427440     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.407557     Document Type: Conference Paper

References (5)