Deep-censoring method for early reliability assessment

International Integrated Reliability Workshop Final Report

Volumn , Issue , 2000, Pages 1-8

  Schafft, Harry A ^a   Head, Linda ^a   Lechner, James A ^a   Gill, Jason ^a   Sullivan, Timothy D ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTROMIGRATION; FAILURE ANALYSIS; RELIABILITY;

DEEP CENSORING;

SEMICONDUCTOR DEVICE TESTING;

EID: 0034427308     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)