Low avalanche noise behaviour in bulk Al0.8Ga0.2As

IEEE International Symposium on Compound Semiconductors, Proceedings

Volumn , Issue , 2000, Pages 519-523

  Ng, B K ^a   David, J P R ^a   Tozer, R C ^a   Rees, G J ^a   Tan, C H ^a   Plimmer, S A ^a   Hopkinson, M ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRONS; IONIZATION; NUMERICAL METHODS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SPURIOUS SIGNAL NOISE;

AVALANCHE MULTIPLICATION MEASUREMENTS; DARK CURRENTS; PHOTOMULTIPLICATION MEASUREMENTS;

AVALANCHE DIODES;

EID: 0034424949     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)