Characterization of two-dimensional colloidal polycrystalline materials using optical diffraction

Journal of the Optical Society of America B: Optical Physics

Volumn 17, Issue 6, 2000, Pages 904-909

  Avrutsky, Ivan ^a   Li, Bing ^a   Zhao, Yang ^a  

^a Wayne State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL DEFECTS; CRYSTAL LATTICES; EVAPORATION; OPTICAL MICROSCOPY; POLYCRYSTALLINE MATERIALS; STATISTICAL METHODS;

FITTING FUNCTIONS;

ELECTROMAGNETIC WAVE DIFFRACTION;

EID: 0034406040     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.17.000904     Document Type: Article

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