Nuclear microscopic studies of inclusions in natural and synthetic emeralds

X-Ray Spectrometry

Volumn 29, Issue 2, 2000, Pages 178-186

  Yu, K N ^a,c   Tang, S M ^a   Tay, T S ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b Tanglin Shopping Centre   (Singapore)

^c CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CALCITE; CHEMICAL ELEMENTS; FELDSPAR; ION BEAMS; PYRITES; SODIUM CHLORIDE; ZINC SULFIDE; ZONING;

FLUX RESIDUES; IN-SITU STUDY; MICROSCOPIC STUDY; NATURAL STONES; POWER; PROTON INDUCED X-RAY EMISSIONS; SEED CRYSTAL; SPECTRA'S; SYNTHETIC STONES;

MICA;

EID: 0034380996     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(200003/04)29:2<178::AID-XRS419>3.0.CO;2-R     Document Type: Article

References (13)

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