Investigations of the phase relations in the quaternary systems Bi2O3/Bi2Ch′3/Bi 2Ch″3 (Ch = S, Se, Te) II. The system Bi2O3/Bi2Se3/Bi2Te 3 - The crystal structure of Bi2O2(TexSe1-x);Untersuchung der phasenbeziehungen in den quaternären systemen Bi2O3/Bi2Ch′3/Bi 2Ch″3 (Ch = S, Se, Te) II. Zum system Bi2O3/Bi2Se3/Bi2Te 3 - Die kristallstruktur von Bi2O2(TexSe1-x)

Zeitschrift fur Anorganische und Allgemeine Chemie

Volumn 626, Issue 9, 2000, Pages 1999-2003

  Schmidt, P ^a   Rademacher, O ^a   Oppermann, H ^a   Dabritz S ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Bismuth dioxide selenide telluride; Crystal structure; Solid solution

Indexed keywords

EID: 0034370284     PISSN: 00442313     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3749(200009)626:9<1999::AID-ZAAC1999>3.0.CO;2-B     Document Type: Article

References (19)

1. P. Schmidt, O. Bosholm, H. Oppermann, Z. Naturforsch. 1997, 52 b, 1461.
2. P. Schmidt, O. Rademacher, H. Oppermann, Z. Anorg. Allg. Chem. 1999, 625, 255.
3. H. Oppermann, H. Göbel, P. Schmidt, H. Schadow, V. Vassilev, I. Markova-Deneva, Z. Naturforsch. 1999, 54 b, 261.
4. H. Boller, Monatsh. Chem. 1973, 104, 916.
5. P. M. Raccah, J. M. Longo, H. A. Eick, Inorg. Chem. 1967, 6, 1471.
6. F. A. Weber, T. Schleid, 9. Vortragstagung der FG Festkörperchemie der GDCh, Saarbrücken 23.-25. 09. 1998.
7. L. G. Sillen, Z. Anorg. Allg. Chem. 1939, 242, 41.
8. A. Lagercrantz, L. G. Sillen, Ark. Kemi, Miner. Geol. 1948, 25, 1.
9. E. Koyama, I. Nakai, K. Nagashima, Acta Crystallogr. 1984, B 40, 105.
10. H. A. Eick, Acta Crystallogr. 1960, 13, 161.
11. R. A. Young, DBWS 9006, Program for Rietveld Analysis of X-Ray and Neutron Powder Diffraction Patterns, school of Physics, Georgia Institute of Technology, Atlanta, USA.
12. G. Sheldrick. SHELXS-86, Program for the Solution of Crystal Structures, University of Göttingen.
13. G. Sheldrick, SHELXL-97, Program for Crystal Structures Determination, University of Göttingen.
14. XEMP, Empirical Absorption Correction Program, Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
15. K. G. Keramidas, G. P. Voutsas, P. I. Rentzeperis, Z. Kristallogr. 1993, 205, 35.
16. J. Ketterer, V. Krämer, Acta Crystallogr. 1986, 42, 1098.
17. L. G. Sillen, Sven. Kern. Tidskr. 1941, 53, 39.
18. G. Gattow, H. Schröder, Z. Anorg. Allg. Chem. 1962, 318, 176.
19. M. El Farissi, D. Mercurio, B. Frit, Mat. Chem. Phys. 1987, 16, 133.