Confidence intervals for secondary parameters following a sequential test

Journal of the Royal Statistical Society. Series B: Statistical Methodology

Volumn 62, Issue 4, 2000, Pages 731-745

  Whitehead, John ^a   Todd, Susan ^a   Hall, W J ^b  

^a UNIVERSITY OF READING   (United Kingdom)

^b UNIVERSITY OF ROCHESTER   (United States)

Author keywords

Binary data; Confidence interval; O'Brien and Fleming test; Sequential analysis; Triangular test

Indexed keywords

EID: 0034354053     PISSN: 13697412     EISSN: None     Source Type: Journal    
DOI: 10.1111/1467-9868.00260     Document Type: Article

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