Surface topography and its influence on the activity of carbon black

KGK-Kautschuk und Gummi Kunststoffe

Volumn 53, Issue 3, 2000, Pages 137-143

  Raab, H ^a,b   Frohlich J ^a,c   Goritz D ^a,b  

^a University of Regensburg ^*

^b UNIVERSITY OF REGENSBURG   (Germany)

^c EVONIK INDUSTRIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

RICHARDSON METHOD; X-RAY SMALL ANGLE SCATTERING;

CRYSTAL ORIENTATION; FRACTALS; IMAGE ANALYSIS; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; SURFACE TOPOGRAPHY; X RAY SCATTERING;

CARBON BLACK;

EID: 0034350381     PISSN: 09483276     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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