Negative exponential disparity based family of goodness-of-fit tests for multinomial models

Journal of Statistical Computation and Simulation

Volumn 65, Issue 1, 2000, Pages 43-61

  Jeong, Dong Bin ^a   Sarkar, Sahadeb ^b  

^a Gangneung Wonju National University   (South Korea)

^b INDIAN INSTITUTE OF MANAGEMENT CALCUTTA   (India)

Author keywords

Goodness of fit; disparity tests; likelihood ratio test; negative exponential disparity; pearson's chi square; power divergence

Indexed keywords

EID: 0034348934     PISSN: 00949655     EISSN: None     Source Type: Journal    
DOI: 10.1080/00949650008811989     Document Type: Article

References (19)

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