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Volumn 37, Issue 6, 2000, Pages 952-955

A novel air-bridge-type gate-data-line crossover to reduce signal delay for a large size AMLCD

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0034347682     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.37.952     Document Type: Article
Times cited : (1)

References (3)
  • 3
    • 0003165149 scopus 로고    scopus 로고
    • Simple process of hillock-free Al-gate metalization without ITO/Al contact problems for large-area TFT-LCDs
    • H. S. Seo, J. B. Choi, D. C. Yun, C. D. Kim and H. S. Soh, Simple process of hillock-free Al-gate metalization without ITO/Al contact problems for large-area TFT-LCDs, SID 98 Digest (1998), p. 375.
    • (1998) SID 98 Digest , pp. 375
    • Seo, H.S.1    Choi, J.B.2    Yun, D.C.3    Kim, C.D.4    Soh, H.S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.