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Volumn 15, Issue 4, 2000, Pages 211-216

Grazing excidence diffraction versus grazing incidence diffraction for strain/stress evaluation in thin films

Author keywords

Grazing incidence; Residual stress evaluation; Thin films; X ray diffraction

Indexed keywords

X RAY DIFFRACTION;

EID: 0034344604     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S088571560001109X     Document Type: Article
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.