Reliability: Rejoinder to Thompson and Vacha-Haase

Educational and Psychological Measurement

Volumn 60, Issue 2, 2000, Pages 196-200

  Sawilowsky, Shlomo S ^a  

^a WAYNE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034340603     PISSN: 00131644     EISSN: None     Source Type: Journal    
DOI: 10.1177/00131640021970457     Document Type: Article

References (18)

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